FIELD: measuring technology.
SUBSTANCE: invention relates to measuring technology, namely to the measurement of microwave parameters of materials in free space. The frequency corresponding to the minimum amplitude of the reflected wave from the sample and the frequency corresponding to the middle of the phase jump of the reflected wave from the sample are measured. The difference between the frequencies is calculated. The tangent of the dielectric loss angle is determined by the formula
,
where 
is the frequency corresponding to the minimum amplitude of the reflected wave from the sample; 
is the frequency corresponding to the middle of the phase jump of the reflected wave from the sample; 
are the constant coefficients.
EFFECT: increasing the accuracy of measuring the tangent of the dielectric loss angle of the material of a flat sample of half-wave thickness in free space.
1 cl, 4 dwg
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