METHOD FOR MEASURING THE RELATIVE COMPLEX DIELECTRIC PERMITTIVITY OF A LOSSY MATERIAL Russian patent published in 2023 - IPC G01R27/26 G01N22/00 G01B15/02 

FIELD: measuring technology.

SUBSTANCE: invention relates to measuring technology, in particular to the measurement of ultra-high-frequency parameters of materials in free space. A method for measuring the relative complex permittivity of a flat sample of a material with dielectric losses in the frequency band of the microwave range, in which the dependence of the complex reflection coefficient is measured using a microwave meter when the electric field of the incident wave is parallel to the plane of incidence and the relative complex permittivity is determined. For each frequency of the microwave range, using the sweep method with a predetermined iteration step, the relative complex permittivity is calculated using the formula:

where i is an imaginary unit;

is an imaginary part of the dielectric constant;

is relative permittivity.

EFFECT: increase in the accuracy of measuring the frequency dependence of the relative complex permittivity of a flat sample material in a wide frequency band in free space.

1 cl, 3 dwg