METHOD OF MEASUREMENT RELATIVE COMPLEX PERMITTIVITY OF MATERIAL WITH LOSSES IN MICROWAVE RANGE Russian patent published in 2017 - IPC G01R27/00 

Abstract RU 2613810 C1

FIELD: electricity.

SUBSTANCE: by means of microwave reflectometer the dependence of the Fresnel reflection coefficient of a flat material sample on the incidence angle is measured in the range from 40 to 90°, when the electric wave field is parallel to the incidence plane, and then, according to the plotting of the dependence of the Fresnel reflection coefficient on the incidence angle, the Brewster angle θv is determined, and the relative complex dielectric permittivity ε of a material sample or a ground surface portion is calculated by the formula ε= (tgθv)2.

EFFECT: providing the possibility of measuring the complex permittivity of flat samples larger compared to the wavelength in the microwave range.

4 dwg

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RU 2 613 810 C1

Authors

Valeev Georgij Galiullovich

Dates

2017-03-21Published

2015-10-06Filed