FIELD: X-ray inspection.
SUBSTANCE: automated x-ray inspection of products of complex shape. The reference structure is sequentially scanned in different planes, an X-ray image is recorded along each scanning plane, the average brightness value of the X-ray image and the standard deviation of the brightness of the X-ray image are determined on each scanning plane of the reference structure. A threshold value is generated on the image of the reference structure at each point of image. The controlled product is scanned in the same planes as the reference design, the X-ray image is recorded along each scanning plane of the controlled product, the average value of the X-ray brightness and the standard deviation of the X-ray brightness of the controlled product are determined, and the average values and standard deviations of the X-ray brightness values are compared. If the average values and standard deviations of the reference design and the inspected product differ by an amount not exceeding the maximum error, then the control is continued by scanning the next plane of the inspected product. If the average values and standard deviations of the reference design and the controlled product differ by more than the maximum error, the image of the controlled product is corrected. Defects are detected in the X-ray image by comparing the X-ray image of the inspected product with the threshold value of the reference design.
EFFECT: providing the ability to increase the reliability of defect detection.
4 cl, 6 dwg, 1 tbl
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Authors
Dates
2024-03-12—Published
2023-08-11—Filed