METHOD AND DEVICE FOR MEASURING NOISE FACTOR OF A MICROCHANNEL PLATE Russian patent published in 2024 - IPC H01J43/04 G01R29/26 G01M11/00 

FIELD: measuring.

SUBSTANCE: invention relates to measurement equipment and can be used to control the value of the noise factor of microchannel plates (MCP) during their manufacture. Method involves measurement and digital processing of signals, at which the values of signal-to-noise ratios of the input and output currents of the microchannel plate are determined, followed by calculation of the noise factor. Input and output currents, as well as corresponding hardware noise and current leakage are measured directly at the input and output of the microchannel plate, measured signals are digitized and differences of values of average values of constant components of currents and corresponding hardware leakages of current at input and output of microchannel plate are calculated, as well as the difference in the mean-square values of the alternating current components and the corresponding hardware noise at the input and output of the microchannel plate. Signal-to-noise ratio of current signals at the input and output of the microchannel plate is then calculated and the noise factor is calculated. Device for measuring the noise factor of the MCP includes power supply units, a computer and a vacuum unit in which a thermionic cathode, an electronic focusing system, a controlled microchannel plate and a screen-anode are installed. At that, the microchannel plate input is connected to the vacuum unit housing, which is grounded, wherein the microchannel plate input and output are connected to the MCP power supply unit, in addition, the input of the microchannel plate is also connected to the thermionic cathode through a series electric circuit consisting of a picoammeter and an accelerating voltage unit, as well as with screen-anode through series electric circuit consisting of nanoammeter and anode power supply unit, wherein the picoammeter housing and the nanoammeter housing are connected to the vacuum unit housing. Picoammeter and the nanoammeter are connected to a computer by means of interface lines. Thermoelectronic cathode is connected to the cathode power supply unit, and the accelerating voltage unit and the anode power supply unit are connected to the power supply network through an isolating transformer.

EFFECT: simplification and improvement of accuracy of measurement of value of noise factor due to simultaneous control of input and output currents of MCP and due to simultaneous accounting of natural noise and leaks in elements of equipment.

2 cl, 1 dwg