DARK CURRENT MEASUREMENT METHOD AND DEVICE FOR ITS IMPLEMENTATION Russian patent published in 2024 - IPC H01J43/04 G01R29/26 

FIELD: measuring.

SUBSTANCE: invention relates to measurement equipment and can be used to control the value of dark current of microchannel plates (MCP) during their manufacture. Method involves determination of dark current as the difference between values of current of the monitored device and current in the anode circuit, wherein additionally, hardware noise and leakage current in the anode circuit are determined using an electrical analogue of the microchannel plate. Current signals from the output of the controlled microchannel plate and from the output of its electrical analogue are converted into digital signals which are processed in a personal computer, and the value of dark current is calculated as the difference of values of constant components measured from the output of the controlled microchannel plate and the output of its electrical analogue. Device implementing the method comprises a chamber for accommodating a controlled device, power supply units and an ammeter, wherein the chamber is made vacuum, in which a disk is installed on the axis, along the perimeter of which there are controlled microchannel plates and their electric analogue made in the form of a dielectric plate with metallized surfaces connected to outputs of a parallel electric circuit consisting of a resistor and a capacitor. Opposite the disc there is an anode which is connected to an ammeter. Positive leads of two power supply units are connected to anode through ammeter, and their negative leads through sliding contacts are connected to metallized surfaces of controlled microchannel plate or its electric analogue, and ammeter is connected to computer.

EFFECT: high accuracy of measuring dark current by taking into account all components of leakage current and hardware noise.

2 cl, 2 dwg