DEVICE FOR DETERMINING THERMAL JUNCTION-TO-CASE RESISTANCE OF LOGIC INTEGRATED MICROCIRCUITS Russian patent published in 2008 - IPC G01R31/317 

Abstract RU 2327178 C1

FIELD: physics.

SUBSTANCE: invention pertains to control of quality of microcircuits based on TTL and Schottky transistor-transistor logic elements. The microcircuit is heated through stepwise variation of the current through the load on a rule, approximated by a harmonic function. The stepwise current variation in the load of the logic element is achieved using a pulse generator, circulating register, AND circuits, electronic commutators and variable resistors. Approximation is done through a double channel oscilloscope, a generator of harmonic signals with change in the variable resistors. The current collecting resistors, the first commutator and the voltmeter are meant for determining the heating power, while the high resistance resistor, the amplifier, detector and the selective voltmeter are for measuring heat sensitive parameters during strobe pulses.

EFFECT: reduction in deviation.

2 dwg

Similar patents RU2327178C1

Title Year Author Number
METHOD FOR DETERMINATION OF HEAT-TRANSFER RESISTANCE FOR DIGITAL CMOS INTEGRATED CIRCUITS 2012
  • Sergeev Vjacheslav Andreevich
  • Panov Evgenij Anatol'Evich
  • Urlapov Oleg Vladimirovich
  • Judin Viktor Vasil'Evich
RU2504793C1
METHOD FOR DETERMINING THERMAL IMPEDANCE OF CMOS DIGITAL INTEGRATED MICROCIRCUITS 2011
  • Sergeev Vjacheslav Andreevich
  • Lamzin Vladimir Aleksandrovich
  • Judin Viktor Vasil'Evich
RU2463618C1
METHOD TO DETERMINE HEAT JUNCTION-TO-CASE RESISTANCE OF DIGITAL INTEGRATED MICROCIRCUITS 2014
  • Sergeev Vjacheslav Andreevich
  • Teten'Kin Jaroslav Gennad'Evich
  • Judin Viktor Vasil'Evich
RU2569922C1
METHOD OF DETERMINING THERMAL RESISTANCE OF DIGITAL INTEGRAL MICROCIRCUITS 2020
  • Yudin Viktor Vasilevich
  • Sergeev Vyacheslav Andreevich
  • Tetenkin Yaroslav Gennadevich
  • Lamzin Vladimir Aleksandrovich
  • Kozlikova Irina Sergeevna
RU2744716C1
METHOD OF DETERMINING THERMAL IMPEDANCE OF VERY LARGE SCALE INTEGRATED CIRCUITS - MICROPROCESSORS AND MICROCONTROLLERS 2012
  • Sergeev Vjacheslav Andreevich
  • Urlapov Oleg Vladimirovich
  • Panov Evgenij Anatol'Evich
RU2521789C2
METHOD FOR MEASURING THE TRANSIENT RESPONSE OF DIGITAL INTEGRATED MICROCHIPS 2020
  • Sergeev Vyacheslav Andreevich
  • Yudin Viktor Vasilevich
  • Lamzin Vladimir Aleksandrovich
RU2766066C1
DEVICE FOR MEASURING JUNCTION-TO-CASE THERMAL RESISTANCE OF SEMICONDUCTOR DIODES 1994
  • Sergeev V.A.
  • Judin V.V.
RU2087919C1
METHOD FOR MEASURING THERMAL IMPEDANCE OF DIGITAL INTEGRATED CIRCUITS 2016
  • Sergeev Vyacheslav Andreevich
  • Tetenkin Yaroslav Gennadevich
RU2649083C1
METHOD FOR DETERMINING THERMAL RESISTANCE OF DIGITAL INTEGRATED MICROCIRCUITS 2007
  • Judin Viktor Vasil'Evich
  • Sergeev Vjacheslav Andreevich
RU2327177C1
METHOD AND APPARATUS FOR MEASURING THERMAL RESISTANCE OF DIGITAL INTEGRAL CIRCUITS 0
  • Sergeev Vyacheslav Andreevich
  • Yudin Viktor Vasilevich
  • Goryunov Nikolaj Nikolaevich
SU1613978A1

RU 2 327 178 C1

Authors

Judin Viktor Vasil'Evich

Sergeev Vjacheslav Andreevich

Dates

2008-06-20Published

2007-01-09Filed