FIELD: semiconductor devices. SUBSTANCE: process involves the following operations: source substrate is connected through junction layer to supporting substrate; part of source substrate is removed, and active components are shaped. Low-resistance layer is formed on source substrate on junction layer side; high-resistance superconductor or antimony-doped superconductor is used as supporting substrate and single-crystalline substrate with epitaxial layer or with dielectric-covered microprofile, or with microprofile partially covered with dielectric, source substrate. EFFECT: facilitated procedure. 3 cl, 10 dwg
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Authors
Dates
1998-01-20—Published
1993-03-02—Filed