FIELD: automation and computer engineering, in particular, magnetic thin-film memory registers and gates. SUBSTANCE: device has silicon substrate which carries first insulating layer, sharp-tipped strip which has two protection layers, which are separated by magnetoresistive layers and thin-film copper layer. Other layers over strip include second insulation layer, conducting layer with feedback circuit and third insulation layer. EFFECT: possibility to design logical gates using spin-gate magnetoresistive structures for operation in heavy conditions. 2 cl, 3 dwg
Title | Year | Author | Number |
---|---|---|---|
THIN-FILM MAGNETIC INVERTER | 1999 |
|
RU2168774C1 |
MAGNETIC NEURON | 2001 |
|
RU2199780C1 |
GATE WITH MEMORY | 1995 |
|
RU2093905C1 |
MAGNETORESISTIVE TRANSDUCER | 2000 |
|
RU2175797C1 |
MAGNETORESISTIVE THRESHOLD NANOELEMENT | 2007 |
|
RU2342738C1 |
MAGNETORESISTIVE MEMORY GATE | 1994 |
|
RU2081460C1 |
MAGNETORESISTIVE THRESHOLD NANOELEMENT | 2008 |
|
RU2377704C1 |
MAGNETORESISTIVE TRANSDUCER | 2003 |
|
RU2236066C1 |
MAGNETORESISTIVE SENSOR | 1994 |
|
RU2066504C1 |
METHOD REDUCING EFFECT OF HYSTERESIS ON RESULTS OF MEASUREMENT OF MAGNETIC FIELD | 1998 |
|
RU2152046C1 |
Authors
Dates
1998-10-10—Published
1996-07-02—Filed