FIELD: nondestructive methods for diagnosing structural integrity of insulating layers deposited on substrate. SUBSTANCE: method involves ellipsometric measurements of film refractive index; in the course of measurements film is elastically deformed to build up tensile stresses in it and its condition is recognized by changes in refractive index caused by deformation. EFFECT: enhanced sensitivity of check due to reduced deformation of films. 1 tbl
Authors
Dates
2001-05-20—Published
1999-04-13—Filed