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2 172 930

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IPC

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Application

2000108584/28, 2000-04-10

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Start date

2000-04-10

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Actual filing date

2000-04-10

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Published

2001-08-27

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Inventor

Artem'Ev B.V.Egorov I.V.Zapuskalov V.G.Maslov A.I.Rolik V.A.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Moskovskoe Nauchno-Proizvodstvennoe Ob"Edinenie

x-RAY THICKNESS GAUGE Russian patent published in 2001 - IPC

Abstract RU 2172930 C1

FIELD: measuring equipment, applicable for measurement of object thickness. SUBSTANCE: the processing circuit in the device is made as a push-pull modulator and divider. The modulator has six resistors of the same quantity, differential amplifier and a switch. The differential amplifier applies a negative feedback. EFFECT: enhanced speed of response, enhanced accuracy and truth of inspection. 2 cl, 3 dwg

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RU 2 172 930 C1

Authors

Artem'Ev B.V.

Egorov I.V.

Zapuskalov V.G.

Maslov A.I.

Rolik V.A.

Dates

2001-08-27—Published

2000-04-10—Filed

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