DEVICE FOR REJECTION OF DIGITAL INTEGRATED MICROCIRCUITS Russian patent published in 2002 - IPC

FIELD: electronics, incoming and outgoing control over quality of integrated microcircuits by value of thermal resistance. SUBSTANCE: device for rejection of digital integrated microcircuits has contact block with terminals for connection of leads of tested microcircuit, source of power supply connected to terminals of supply leads of tested microcircuit, generator of change-over pulses and modulator. One input of modulator is connected to generator of change-over pulses, output of modulator is connected to terminals for connection of leads which are inputs of several logic elements of tested microcircuit. Device is supplemented with generator of linearly rising voltage, control unit, former of threshold voltage, comparator, former of gate pulse, time selector, counter and indicator. Output of control unit is connected to control input of counter, to one input of former of gate pulse and to control input of generator of linearly rising voltage which output is connected to second input of modulator. Terminal for connection of logic element of tested microcircuit which logic state does not change is connected to input of former of threshold voltage and to one input of comparator whose second input is connected to output of former of threshold voltage and whose output is connected to second input of former of gate pulse. Output of former of gate pulse is connected to control input of time selector whose signal input is connected to output of generator of change-over pulses and whose output is connected to counting input of counter which outputs are connected to inputs of indicator. EFFECT: increased speed of test and rejection. 2 dwg