FIELD: optoelectronics, holography, interferometry, Fourier spectroscopy. SUBSTANCE: invention deals with electronic measurement of spatial-time distribution of amplitudes and phases of light waves. Photodetector incorporates photoelectric layer, substrate and feeding electrodes and is made of elements which have total transmission over 10% in limits of working area of photodetector and summary deviation from uniform change of optical thickness over working area and over working length of photodetector under λmin/4. Photoelectric layer has optical thickness within limits of working area less than λmin/2, or above λ0/2 and not multiple of λ0/2 where λmin is length of wave of short-wave boundary of working spectral range of photodetector; λ0 is working length of wave of photodetector. EFFECT: simplified optical circuit, reduced dimensions of optical devices. 2 cl, 7 dwg
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Authors
Dates
2004-02-20—Published
2001-11-23—Filed