FIELD: micro-electronics industry.
SUBSTANCE: method includes, after prior results of test for each transistor type, performing stability tests in constant mode of current amplification coefficient measurement during 20-30 minutes, results of which are used to estimate transistor stability.
EFFECT: shortened test time with no effect from stress density current.
4 tbl
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| METHOD FOR DETECTING A PRIORI DEFECTIVE TRANSISTORS | 2003 |
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| METHOD FOR SORTING SEMICONDUCTOR GOODS | 2005 |
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| PROTECTED CONSTANT VOLTAGE REGULATOR | 1991 |
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| METHOD FOR SORTING OUT OF POTENTIALLY UNRELIABLE TRANSISTORS | 2010 |
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| METHOD FOR DETERMINATION OF POTENTIALLY UNSTABLE SEMICONDUCTOR DEVICES | 2003 |
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| METHOD OF REJECTING TRANSISTORS | 0 |
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SU1049837A1 |
| METHOD FOR CLASSIFICATION OF TRANSISTORS WITH RESPECT TO LEAKAGE CURRENT LEVELS | 1992 |
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RU2098839C1 |
| METHOD FOR STABILISATION OF ELECTRIC PARAMETERS OF SEMICONDUCTOR DEVICES SEALED IN PLASTIC | 2011 |
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RU2484550C1 |
