FIELD: technology for testing and controlling semiconductor goods (diodes, transistors, integration circuits), possible use for sorting on basis of potential reliability criterion both during manufacturing and at outlet control of radio-electronic equipment manufacturing factories.
SUBSTANCE: method includes following operations: measuring intensiveness of noises before and after external influence; and following selection of potentially unreliable products is performed on basis of estimation of noise intensiveness increase coefficient of each product after at least 10 thermo-cycles in range of extreme temperatures, allowed by technical conditions, in comparison to original value.
EFFECT: increased trustworthiness and expanded functional capabilities of method for sorting semiconductor devices.
1 tbl
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD OF SORTING SEMICONDUCTOR ARTICLES ACCORDING TO RELIABILITY | 2009 |
|
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| METHOD FOR GRADING SEMICONDUCTOR DEVICES | 2003 |
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| METHOD FOR NON-DESTRUCTIVE CONTROL OF SECONDARY BREAKDOWN RESISTANCE OF POWERFUL MDS TRANSISTORS | 2005 |
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| DEVICE FOR PRESORTING OF SEMICONDUCTOR PRODUCTS ON BASIS OF THEIR AMPERE-NOISE CHARACTERISTICS | 2004 |
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| METHOD FOR DETECTING POTENTIALLY UNRELIABLE BIPOLAR TRANSISTORS | 2005 |
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| PROCESS OF INSPECTION OF INTEGRATED CIRCUITS FOR DEFECTS | 1998 |
|
RU2143704C1 |
| MODE OF SEPARATION INTEGRAL SCHEMES ACCORDING TO RELIABILITY | 2005 |
|
RU2290652C2 |
| METHOD OF SEMICONDUCTOR ARTICLE CLASSIFICATION BY RELIABILITY | 2010 |
|
RU2515372C2 |
