FIELD: electricity.
SUBSTANCE: coefficient of resistors amplification is measured in a common-emitter circuit at normal and high temperature. Absolute difference value Δ=h21e100°C-h21e20°C and values of relative change in amplification coefficient K= h21e100°C/h21e20°C are calculated for each transistor; h21e100°C, h21e20°C are values of amplification coefficient at high and normal temperature respectively. Transistors are sorted out when they meat two criteria simultaneously: Δ≥Δav; K≥Kav, where Δav and Kav are average values of absolute difference and relative change in retrieval for this type of transistors.
EFFECT: simplifying and enlarging functional capabilities.
1 tbl
Title | Year | Author | Number |
---|---|---|---|
METHOD OF COMPARATIVE EVALUATION OF BATCHES OF TRANSISTORS BY QUALITY AND RELIABILITY | 2020 |
|
RU2739480C1 |
METHOD FOR DETECTING A PRIORI DEFECTIVE TRANSISTORS | 2003 |
|
RU2234163C1 |
METHOD FOR NON-DESTRUCTIVE DIAGNOSTICS OF INTEGRATED CIRCUITS | 2020 |
|
RU2743708C1 |
METHOD FOR SORTING OUT SEMICONDUCTOR DEVICES | 2003 |
|
RU2253168C1 |
METHOD FOR DETECTING POTENTIALLY UNRELIABLE BIPOLAR TRANSISTORS | 2005 |
|
RU2309417C2 |
METHOD TO DIVIDE TRANSISTORS BY RELIABILITY | 2010 |
|
RU2507525C2 |
METHOD FOR DETECTING POTENTIALLY UNSTABLE TRANSISTORS | 2003 |
|
RU2253125C1 |
METHOD FOR DETERMINING POTENTIALLY UNSTABLE DIGITAL INTEGRAL CIRCUITS | 2004 |
|
RU2257591C1 |
METHOD FOR ORIENTED MODIFICATION OF SEMICONDUCTOR DEVICE STRUCTURES USING PULSE ELECTROMAGNETIC FIELD | 2013 |
|
RU2545077C1 |
METHOD FOR SCREENING POTENTIALLY UNRELIABLE INTEGRAL CIRCUITS | 2004 |
|
RU2276378C1 |
Authors
Dates
2013-08-20—Published
2010-05-25—Filed