FIELD: microelectronics; testing and checking semiconductor devices.
SUBSTANCE: noise-factor is measured on sampled semiconductor device at currents up to 1 mA, ampere-noise characteristics are constructed for maximal and minimal values, current causing highest difference in ampere-noise characteristics is evaluated, and mean noise-factor value is found for given currents. is used for sorting out Lot of instruments is sorted out with respect to their reliability by deviation of noise-factor of each device from mean value at given current.
EFFECT: enhanced reliability and enlarged functional capabilities without bringing in uncontrolled faults.
1 cl, 1 dwg
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