PROCEDURE OF SELECTION OF ELECTRON ARTICLES BY STABILITY AND RELIABILITY Russian patent published in 2001 - IPC

FIELD: microelectronics. SUBSTANCE: invention deals with selection of electron articles by preset levels of stability and reliability. Procedure includes formation of representative " instructive " sample per each type of selection from tested lot of articles, its irradiation by small doze causing significant change of two parameters as minimum specified in advance in specifications or additional ones, distribution of articles of sample by degree of change of parameters caused by irradiation, firing of articles to restore parameters and testing sample for radiation stability till 50% of failures are achieved in case of inspection of tested lot for radiation stability, test of sample for median resource or in the course of mean-time- between-failures or in the course of time necessary to determine required resource in case of inspection of tested lot for reliability, test of sample for reliability under combined action of radiation, heat and electric loads till 50% of failures are obtained in case of inspection of tested lot by levels of mean-time-between-failures under conditions of combined action of destabilizing factors. Procedure provides for selection of most radiation-proof and reliable devices with guaranteed indices of stability and reliability which are 1.5-2.0 times higher than average mean-time- between-failures and by half-order or order of magnitude greater than average indices of stability. EFFECT: procedure is highly adaptable for employment, does not require great expenses and does not deteriorate operational characteristics of articles. 11 dwg