FIELD: micro-electronics, namely, ensuring of reliability of a batch of bipolar transistors due to detection of potentially unreliable devices, possible use during production and during usage.
SUBSTANCE: method for detecting potentially unreliable bipolar transistors includes measuring low frequency noise of transistor, which is performed at two transitions emitter-base, collector-base at two current values, and decision of reliability of devices is made on basis of quality control criterion B, determined as 
, where I1, I2 - current power values, U2 ne1, U2 ne2 - square voltage of emitter-base transition noise with current power respectively for first and second values; U2 nc2 - square voltage of collector-base transition noise with current power for second value.
EFFECT: increased trustworthiness of method, simplification of method due to measurement of different transitions of one and the same transistor.
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD FOR DETECTING A PRIORI DEFECTIVE TRANSISTORS | 2003 |
|
RU2234163C1 |
| METHOD FOR SORTING OUT SEMICONDUCTOR DEVICES | 2003 |
|
RU2253168C1 |
| METHOD FOR SORTING SEMICONDUCTOR GOODS | 2005 |
|
RU2289144C2 |
| METHOD TO DIVIDE TRANSISTORS BY RELIABILITY | 2010 |
|
RU2507525C2 |
| METHOD FOR DETERMINING RESISTANCE OF MICROWAVE SEMICONDUCTOR DEVICES TO EFFECT OF IONIZING RADIATIONS | 2015 |
|
RU2602416C1 |
| METHOD FOR NON-DESTRUCTIVE CONTROL OF SECONDARY BREAKDOWN RESISTANCE OF POWERFUL MDS TRANSISTORS | 2005 |
|
RU2307368C2 |
| METHOD FOR RELIABILITY SEPARATION OF SEMICONDUCTOR PRODUCTS | 2005 |
|
RU2309418C2 |
| METHOD OF SEMICONDUCTOR ARTICLE CLASSIFICATION BY RELIABILITY | 2010 |
|
RU2515372C2 |
| PROCEDURE ESTABLISHING POTENTIALLY UNRELIABLE SEMICONDUCTOR DEVICES | 2002 |
|
RU2230335C1 |
| METHOD OF SORTING SEMICONDUCTOR ARTICLES ACCORDING TO RELIABILITY | 2009 |
|
RU2455655C2 |
