PROBE FOR SCANNING MICROSCOPY AND METHOD FOR MANUFACTURING SAID PROBE Russian patent published in 2005 - IPC

Abstract RU 2266574 C2

FIELD: nano-technological equipment engineering.

SUBSTANCE: probe with base has from 1 to 50 needles. Base diameter is from 10 to 30 nm. Length is from 10 to 300 nm. Needle tip curvature radius is 0,7-2 nm. Needles are made of substance with polycrystalline structure. Method for making probe for scanning probe microscopy includes growing needles at tip of probe base. Tip of probe base is positioned on electrode. Growing is performed in steams of organic connection, containing material element of needles. By means of vacuum dispersion in high-frequency charge. To electrode, with probe base positioned thereupon, positive voltage is applied.

EFFECT: universality, higher productiveness, increased resolution of produced probes due to production of probes with lesser radius.

2 cl, 1 dwg

Similar patents RU2266574C2

Title Year Author Number
CANTILEVER WITH WHISKER PROBE AND METHOD FOR MANUFACTURING SAME 1999
  • Givargizov Evgenij Invievich
  • Obolenskaja Lidija Nikolaevna
  • Stepanova Alla Nikolaevna
  • Mashkova Evgenija Sergeevna
  • Givargizov Mikhail Evgen'Evich
RU2275591C2
PROBE FOR SCANNING PROBE MICROSCOPY AND METHOD OF ITS MANUFACTURING (EMBODIMENTS) 2017
  • Sinev Ivan Sergeevich
  • Mukhin Ivan Sergeevich
  • Samusev Anton Kirillovich
  • Makarov Sergej Vladimirovich
  • Komissarenko Filipp Eduardovich
RU2660418C1
PROBE FOR GETTING LOCAL AMPLIFIED GIANT COMBINATION SCATTERING SPECTRA AND METHOD OF MAKING THE PROBE (VERSIONS) 2005
  • Klinov Dmitrij Vladimirovich
  • Mochalov Konstantin Evgen'Evich
  • Volkov Aleksej Dmitrievich
RU2295784C1
METHOD OF DETERMINING SHAPE AND DIMENSIONS OF PROBE MICROSCOPE NEEDLE POINTS 2010
  • Kartashev Vladimir Alekseevich
  • Kartashev Vsevolod Vladimirovich
RU2449294C2
PROBE FOR LOCAL ANODE OXIDATION OF MATERIALS 2009
  • Meshkov Georgij Borisovich
  • Sinitsyna Ol'Ga Valentinovna
  • Jaminskij Igor' Vladimirovich
RU2383078C1
DEVICE FOR MEASURING SIZES OF NEEDLE TIP FOR SCANNING MICROSCOPE 2006
  • Bobrinetskij Ivan Ivanovich
  • Nevolin Vladimir Kirillovich
  • Stroganov Anton Aleksandrovich
  • Chaplygin Jurij Aleksandrovich
RU2308414C1
METHOD OF PROBE ADAPTATION FOR CHEMICAL FORCE MICROSCOPY 2008
  • Bajankin Vladimir Jakovlevich
  • Bystrov Sergej Gennad'Evich
  • Zhikharev Aleksandr Vladimirovich
RU2381512C2
PROCESS OF FORMATION OF SENSOR ELEMENT OF SCANNING SOUNDING MICROSCOPE 2000
  • Bykov V.A.
  • Saunin S.A.
  • Mikhajlov G.M.
  • Aristov V.V.
  • Dremov V.V.
RU2220429C2
CANTILEVER WITH SINGLE-ELECTRODE TRANSISTOR FOR PROBING MICROSCOPY 2012
  • Krupenin Vladimir Aleksandrovich
  • Presnov Denis Evgen'Evich
  • Amitonov Sergej Vladimirovich
  • Snigirev Oleg Vasil'Evich
  • Trifonov Artem Sergeevich
RU2505823C1
METHOD OF POINT-LIKE SILICATE THREAD CRYSTALS GROWING 2016
  • Nebolsin Valerij Aleksandrovich
  • Dunaev Aleksandr Igorevich
  • Tatarenkov Aleksandr Fedorovich
  • Samofalova Alevtina Sergeevna
RU2653026C1

RU 2 266 574 C2

Authors

Klinov D.V.

Dates

2005-12-20Published

2003-09-29Filed