FIELD: measurement equipment.
SUBSTANCE: invention relates to microelectronics, namely, to methods to ensure quality and reliability of integrated circuits (IC), and may be used for comparative evaluation of reliability of IC lots both at the stage of production and at incoming inspection at enterprises that manufacture radioelectronics equipment. The method substance consists in the fact that electrical parameters specified in technical conditions under the following supply voltages are measured at random samples of circuits from lots: 1, 1.25, 1.5, 1.75 and 2 V. Then integral curves are built for distribution of integrated circuits by values of supply voltages, and conclusions are drawn for compared batches.
EFFECT: reduced labour intensiveness and also increased functional capabilities of the method.
1 dwg
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