PLASMO-CHEMICAL LOW-PRESSURE REACTOR FOR ETCHING AND DEPOSITING MATERIALS Russian patent published in 2007 - IPC C23C16/513 H01L21/306 C23C14/24 

Abstract RU 2293796 C2

FIELD: microelectronics techniques, micro- and nano-technologies, namely design of plasmo-chemical reactor in which processes for etching and depositing different materials are realized.

SUBSTANCE: plasmo-chemical reactor includes reaction chamber, inductor, substrate holder, thin-wall cylindrical metallic shield and heat removal struts whose properties provide rate of temperature change of screen and time period for setting is stationary temperature. Thin-wall cylindrical metallic screen is secured to heat removal struts inside reaction chamber and it is spaced from walls of reaction chamber.

EFFECT: possibility for separate control of basic content of plasma composition and for depositing high-quality coating.

2 cl, 1 dwg, 1 ex

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RU 2 293 796 C2

Authors

Amirov Il'Dar Iskanderovich

Izjumov Mikhail Olegovich

Morozov Oleg Valentinovich

Dates

2007-02-20Published

2005-01-11Filed