METHOD OF SORTING INTEGRATED CIRCUITS ACCORDING TO RELIABILITY Russian patent published in 2014 - IPC G01R31/26 

FIELD: radio engineering, communication.

SUBSTANCE: invention relates to control of quality and reliability of integrated circuits (IC), both digital and analogue, and can be used in the manufacturing process and during acceptance test at electronic equipment manufacturing companies. An electrical information-bearing parameter is measured on a representative IC sample at three supply voltages: critical, rated and maximum allowable according to specifications. A coefficient characterising IC reliability is found: $$K=\frac{A_{U_{all}}-A_{U_{rat}}}{A_{U_{rat}}-A_{U_{CSV}}},$$ where $$A_{U_{all}},$$ $$A_{U_{rat}},$$ $$A_{U_{CSV}}$$ are values of electrical information-bearing parameters at the allowable, rated and critical supply voltage, respectively.

EFFECT: broader functional capabilities.

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