FIELD: electricity.
SUBSTANCE: method for comparative evaluation of reliability of batches of integrated circuits, according to which root-mean-square noise voltage values are measured on identical arbitrary circuit samples from the batches. Low-frequency noise is measured at "input-common point" leads at frequency of up to 200 Hz. Batches are compared on the average value of low-frequency noise in a sample.
EFFECT: improved functional capabilities of the method.
1 dwg
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