FIELD: electricity.
SUBSTANCE: invention refers to electronic industry and can be used for testing and sorting out of semi-conducting components during their manufacturing and operation. Sorting out of semi-conducting components including measurement of diagnostic characteristics (volt-ampere characteristics, capacity-voltage characteristics, ampere-noise characteristics, low-frequency noise, power supply critical voltage, reverse current of p-n semiconductors, etc.) includes influence on semi-conducting components by high-frequency electromagnetic field. The difference is that the measurement of diagnostic characteristics is performed before and after high-frequency electromagnetic field influence. The difference of semi-conducting components before and after the influence is checked.
EFFECT: revealing of less stable semi-conducting components.
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