FIELD: physics.
SUBSTANCE: method of determining thickness of dielectric coating deposited on a metal substrate involves exciting surface electromagnetic waves in the dielectric coating and reception of these waves after their propagation in the dielectric coating. According to the invention, the HE11 mode of surface electromagnetic waves is allowed to exist in the dielectric coating during excitation and during reception, attenuation of this mode is recorded and when complete attenuation is achieved, thickness of the coating is determined using a proposed formula.
EFFECT: invention simplifies the process of measuring thickness of dielectric coating.
1 dwg
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Authors
Dates
2009-10-10—Published
2008-06-06—Filed