METHOD OF ADJUSTING SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE FOR REALSING SAID METHOD Russian patent published in 2010 - IPC G02B21/00 

Abstract RU 2382389 C2

FIELD: physics; optics.

SUBSTANCE: invention relates to scanning microscopy. The method involves calibration of the scanner and/or positioning the probe based on an interference pattern obtained through additional use of a light source and dividing the stream of light into two coherent streams with pass through different optical paths. The light streams are then converged and directed to the video observation system of the microscope or an additional video observation system. When calibrating the scanner, one of the light streams undergoes reflection from the surface of the sample and/or probe, and when positioning the probe, the light stream undergoes reflection from the surface of the sample.

EFFECT: increased information content of scanning, with easier adjustment of the microscope.

7 cl, 11 dwg, 2 ex

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RU 2 382 389 C2

Authors

Men'Shikov Evgenij Aleksandrovich

Gavrilko Dmitrij Jur'Evich

Rashkovich Leonid Nikolaevich

Chernov Aleksandr Aleksandrovich

Shustin Oleg Arkad'Evich

Jaminskij Igor' Vladimirovich

Dates

2010-02-20Published

2008-04-28Filed