METHOD OF FORMING MAGNETIC TUNNEL JUNCTION BASED ON NANOSIZE METAL-INSULATOR-METAL STRUCTURES AND MAGNETIC TUNNEL JUNCTION STRUCURE BASED ON NANOSIZE METAL-INSULATOR-METAL STRUCTURES (VERSIONS) Russian patent published in 2010 - IPC H01L21/8229 B82B3/00 

Abstract RU 2394304 C2

FIELD: physics.

SUBSTANCE: method of forming a magnetic tunnel junction based on nanosize metal-insulator-metal structures involves formation of a magnetic tunnel junction on a substrate which has a freely magnetising layer, a fixed magnetisation layer and a tunnel insulating layer. The tunnel insulating layer is formed by depositing a dielectric layer on the freely magnetising layer. An iron layer is deposited onto the substrate in a vacuum and a silicon layer is then deposited on the iron layer. Further, the surface of the deposited silicon is oxidised, after which a silicon layer is deposited on the resulting silicon oxide layer and an iron layer is then deposited on top. Two layers of ferromagnetic silicide are then formed at the same time under the silicon oxide layer and over the silicon oxide layer through a solid-phase reaction at 400-650°C.

EFFECT: simplification of the method, shorter time for formation of a magnetic tunnel junction and obtaining high values of spin-polarisation due to use of ferromagnetic semimetals as electrodes with easy integration into existing silicon technology.

11 cl, 2 dwg, 1 ex

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RU 2 394 304 C2

Authors

Gojkhman Aleksandr Jur'Evich

Zenkevich Andrej Vladimirovich

Lebedinskij Jurij Jur'Evich

Dates

2010-07-10Published

2007-12-26Filed