FIELD: electrical engineering.
SUBSTANCE: invention relates to electrical engineering. Method of making a magnetic tunnel junction suitable for a magnetic random access memory (MRAM) cell and comprising a first ferromagnetic layer, a tunnel barrier layer, and a second ferromagnetic layer comprises: forming a first ferromagnetic layer; forming a tunnel barrier layer; and forming a second ferromagnetic layer; wherein said forming tunnel barrier layer (22) comprises depositing a layer of metallic Mg; and oxidising deposited layer of metallic Mg so as to transform metallic Mg into MgO. Step of forming tunnel barrier layer is performed at least twice so that tunnel barrier layer comprises at least two layers of MgO.
EFFECT: technical result consists in reduced defectiveness and high breakdown voltage.
10 cl, 3 dwg
Title | Year | Author | Number |
---|---|---|---|
METHOD OF FORMING COPPER DISTRIBUTION WITH A THICK COBALT-CONTAINING INSERT IN THE STRUCTURE OF DEVICES OPERATING BASED ON MAGNETIC TUNNEL JUNCTION | 2018 |
|
RU2694289C1 |
MAGNETIC RANDOM ACCESS MEMORY CELL WITH LOW POWER CONSUMPTION | 2012 |
|
RU2573757C2 |
MAGNETIC TUNNEL JUNCTION DEVICE WITH SEPARATE READ AND WRITE PATHS | 2008 |
|
RU2453934C2 |
MAGNETIC TUNNEL JUNCTION HAVING POLARISING LAYER | 2012 |
|
RU2573756C2 |
METHOD OF FORMING A FIXED DISTRIBUTION OF INDUCED MAGNETIC FIELD IN A MAGNETIC STRUCTURE FORMED IN AN INTEGRATED CIRCUIT, AND AN INTEGRATED CIRCUIT COMPRISING A MAGNETIC STRUCTURE | 2019 |
|
RU2723233C1 |
MULTIBIT CELL WITH SYNTHETIC STORAGE LAYER | 2012 |
|
RU2573457C2 |
MEMORY CELL AND METHOD OF FORMING MAGNETIC TUNNEL JUNCTION (MTJ) OF MEMORY CELL | 2009 |
|
RU2469441C2 |
CMOS/SOI MRAM MEMORY INTEGRATED WITH VLSI AND METHOD FOR PRODUCTION THEREOF (VERSIONS) | 2012 |
|
RU2532589C2 |
MAGNETIC MEMORY ELEMENT | 2011 |
|
RU2585578C2 |
METHOD OF FORMING MAGNETORESISTIVE MEMORY ELEMENT BASED ON TUNNEL JUNCTION AND STRUCTURE THEREOF | 2012 |
|
RU2522714C2 |
Authors
Dates
2016-09-27—Published
2012-09-07—Filed