FIELD: information technology.
SUBSTANCE: flash memory element for electrically programmable read-only memory has a semiconductor substrate on which there is a source and a drain, on which a tunnel layer, a memory layer and a gate are made in series between the source and the drain. The memory layer is made from a dielectric with high concentration of electron and hole traps and permittivity value which is greater than permittivity of silicon nitride. The memory layer may be made from the following material: TiO2, Ta2O5, AlxTayOz, TaOxNy, HfO2, HfSiOxNy, HfOxNy, Er2O3, La2O3, ZrO2, ZrOxNy, ZrSiOx, Gd2O3, Y2O3, Al2O3, AlOxNy. The memory element may have a blocking layer between the memory layer and the gate.
EFFECT: invention reduces voltage (up to 6 V) and cuts on time for recording and deleting information (up to 10 mcs).
6 cl, 1 dwg
Title | Year | Author | Number |
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MEMORY GATE FOR READ-ONLY MEMORY UNIT | 1981 |
|
SU1012704A1 |
MEMORY UNIT | 0 |
|
SU1582890A1 |
Authors
Dates
2010-10-20—Published
2009-05-18—Filed