METHOD OF ACCELERATING MEASUREMENT OF SURFACE TOPOGRAPHY FOR SCANNING PROBE MICROSCOPE Russian patent published in 2011 - IPC G01B11/24 G01Q10/06 B82B3/00 

Abstract RU 2428655 C2

FIELD: physics.

SUBSTANCE: in the method of measuring surface topography and properties for a scanning probe microscope, scanning is carried out in a direction parallel the surface of the sample on a given path. Data are recorded during forward and backward pass and in order to generate a signal which controls displacements perpendicular to the surface of the sample, an array of values of the control signal recorded on the previous scanning line is used together with an array of values of the mismatch error signal, multiplied by the calibration coefficient.

EFFECT: high speed of scanning and reduced measurement errors.

12 cl, 8 dwg

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RU 2 428 655 C2

Authors

Bykov Viktor Aleksandrovich

Bykov Andrej Viktorovich

Kotov Vladimir Valer'Evich

Malovichko Ivan Mikhajlovich

Ostashchenko Artem Jur'Evich

Leesment Stanislav Igorevich

Dates

2011-09-10Published

2009-10-07Filed