METHOD FOR OBTAINING POROUS SILICON DIOXIDE Russian patent published in 2012 - IPC H01L21/316 B82B3/00 

Abstract RU 2439743 C1

FIELD: metallurgy.

SUBSTANCE: in method for obtaining porous film of silicon dioxide of nanometric thickness the film of silicon dioxide is modified with carbon by adding graphite discs to silicon target during magnetron diffusion; formation of pores is performed during execution of chemical reaction of carbon with oxygen on the substrate at the stage of formation of dielectric film. Invention provides obtaining of porous layers of silicon dioxide with various pore concentration.

EFFECT: formed film has high adsorption capacity, which allows using it in gas sensors.

3 dwg

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RU 2 439 743 C1

Authors

Usov Sergej Petrovich

Sakharov Jurij Vladimirovich

Trojan Pavel Efimovich

Dates

2012-01-10Published

2010-05-11Filed