METHOD FOR COMPARATIVE ASSESSMENT OF RELIABILITY OF SEMICONDUCTOR PRODUCTS IN PLASTIC ENCLOSURES Russian patent published in 2012 - IPC G01R31/26 

Abstract RU 2464583 C2

FIELD: electricity.

SUBSTANCE: at identical samples from compared batches of semiconductor products in plastic enclosures, electric parameters are measured, then they are boiled in distilled water for 2-3 hours, and electric parameters are again measured after 2 hours of their soaking under normal conditions. Batches are compared on the basis of test results.

EFFECT: increased efficiency of comparative tests performance for moisture resistance of semiconductor products in plastic enclosures.

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RU 2 464 583 C2

Authors

Gorlov Mitrofan Ivanovich

Tikhonov Roman Mikhajlovich

Meshkova Marija Aleksandrovna

Dates

2012-10-20Published

2009-11-17Filed