FIELD: measurement equipment.
SUBSTANCE: invention relates to measurement equipment and may be used to measure the condition of the surface of the spacecraft, and also other surfaces in a nanometer range. The scanning probe microscope combined with the spacecraft comprises a measurement unit, including a probe module with at least one probe, a scanning device and a unit of probe module approach with at least one measurement zone, and also a control unit that may interact with the measurement unit. The measurement unit is located outside the spacecraft comprising a tight body and is coupled with it by means of a connection element. The measurement zone is located on the outer surface of the tight body.
EFFECT: expansion of functional capabilities.
11 cl, 10 dwg
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