COMPLEX OF PROBE MICROSCOPY FOR WORK IN OUTER SPACE AND ATMOSPHERE Russian patent published in 2022 - IPC G01Q70/00 B64G1/66 B64G4/00 

FIELD: instrumentation.

SUBSTANCE: invention relates to the field of instrumentation and can be used to create autonomous space laboratories based on scanning probe microscopes. The substance of the invention lies in the fact that in the probe microscopy complex for working in outer space and the atmosphere, containing at least one probe microscopy module 1, including a scanning module 2 with a probe holder 3 and a probe 4 fixed on it with a tip 5, which also includes a holder sample 7, installed on the preliminary approach module 8 of the sample holder 7 with the probe 4, where the scanning module 2 and the preliminary approach module 8 are installed on the base 9, which also contains the power module 10 and at least one control unit 11, which is electrically coupled to the power module 10 and a probe microscopy module 1, a chassis 12 and at least one space communication module 13 are inserted, electrically coupled to the control unit 11, while the base 9 is fixed to the chassis 12.

EFFECT: reduction of measurement error.

22 cl, 10 dwg