METHOD TO MEASURE NOISE LEVEL OF MPD UNITS Russian patent published in 2014 - IPC G01R31/26 

FIELD: measurement equipment.

SUBSTANCE: method to measure noise of units in a photodetector (PD) involves measurement of the noise voltage U_n1 with PD power supply off, measurement of the noise voltage U_n2 with PD power supply on and prescribed PD storage time, calculation of the PD noise voltage U_n as per the formula: $$U_n=\sqrt{U_{n2}^2-U_{n1}^2}.$$ Additionally the noise voltage U_n3 with power supply on and zero PD storage time is measured and noise level of a matrix array camera (MAC) U_nMAC and of a large-scale integrated circuit (LSIC) U_nLSIC is calculated as per the formulas: $$U_{\text{nMAC}}=\sqrt{U_{n2}^2-U_{n3}^2},$$ $$U_{\text{nLSIC}}=\sqrt{U_{n3}^2-U_{n1}^2}.$$

EFFECT: separate measurement of noise for a matrix array camera and a large-scale integrated circuit.

3 dwg, 1 tbl