FIELD: instrumentation.
SUBSTANCE: proposed method consists in fitting the locating element with taper hole at mounting face. Counter is placed on locating element to provided for probe spread relative to taper hole axis and perpendicularity of probe and hole axes. Measurement object is fitted by its spherical surface in taper hole so that measured surfaces are located on opposite sides of taper hole axis and probe contacts with first measured surface. Measurement object is swung in taper hole to ensure the probed working surface fit with said first measurement surface. Counter readings are taken. Measurement object is refitted in locating element. Measurement jobs are repeated. Counter second readings are taken. Departure from preset spacing from measured surfaces to spherical surface centre are defined by counter readings while by their half-difference departure from symmetry of surface relative said centre is defined.
EFFECT: simplified process, higher efficiency and accuracy.
1 dwg
