METHOD OF DETERMINING VALUE OF LONGITUDINAL DISPLACEMENT OF THERMAL CATHODE CAUSED BY HEATING THEREOF IN MICROWAVE DEVICE (VERSIONS) Russian patent published in 2016 - IPC H01J9/04 

FIELD: electronic equipment.

SUBSTANCE: invention relates to electronic engineering and can be used in making electron guns with hot cathodes for microwave devices. Method for determining value of longitudinal displacement of hot cathode (Δk) caused by heating it in a microwave device includes measuring current of gun I_izm. at zero and one or more negative with respect to cathode voltages on focusing electrode (FE) being determined from comparison Δk I_izm. with values of current gun and $${\text{I}}_{\text{Δ}\text{k}}{}_{\text{1}}$$ $${\text{I}}_{\text{Δ}\text{k}}{}_{\text{2}}$$ calculated for two different longitudinal displacements of cathode Δk₁ and Δk₂ at same voltage value on FE, in which gun current I_izm. was measured according to formula: $$\text{Δk}={\text{Δk}}_{\text{1}}+\left({\text{Δk}}_{\text{2}}-{\text{Δk}}_{\text{1}}\right)\times \frac{{\text{I}}_{\text{izm}\text{.}}-\text{IΔ}{\text{k}}_{\text{1}}}{\text{IΔ}{\text{k}}_{\text{2}}-\text{IΔ}{\text{k}}_{\text{1}}}.$$ Another embodiment includes a method of measuring current I_{0 izm.} guns at zero with respect to cathode voltage U₀ on focusing electrode (FE) and gun current I_{1 izm.} with a negative voltage U₁ on FE and comparing relative difference ΔI / I_0izm. current measured values with relative differences $${\text{ΔI/I}}_{\text{0}\Delta k\text{1}},$$ $${\text{ΔI/I}}_{\text{0}\Delta k2}$$ calculated current values where ΔI / I_0izm.= (I_0izm.-I_1izm.) / I_0izm., and

$${\text{ΔI/I}}_{\text{0}\Delta k1}=\left({\text{I}}_{\text{0}\Delta k1}-{\text{I}}_{\text{1}\Delta k1}\right)/{\text{I}}_{\text{0}\Delta k1}$$ $${\text{ΔI/I}}_{\text{0}\Delta k2}=\left({\text{I}}_{\text{0}\Delta k2}-{\text{I}}_{\text{1}\Delta k2}\right)/{\text{I}}_{\text{0}\Delta k2}$$ - relative difference between values of current gun, designed for two different displacements Δk₁ and Δk₂, and at same values of U₀, U₁ on FE and Δk based on a comparison is given by:

EFFECT: technical result is simplification of technology determine value Δk while ensuring high accuracy of said definition that allows to produce a gun and a magnetic focusing system with small fluctuations in transit channel of beam microwave devices, and thereby prevent breakdown of microwave device.

2 cl, 3 dwg