FIELD: physics.
SUBSTANCE: invention relates to formation of scanning microscopes probes and their structures, namely to cantilevers consisting of a console and a needle. The probe for scanning devices contains a cantilever on a massive holder and a monolithic cantilever nib, located on the free part of the cantilever. The cantilever is made of a single crystal metal layer and the nib is epitaxial relatively to this level.
EFFECT: invention provides conductivity while improving resolution and increasing the reliability of the probe.
5 cl, 1 dwg
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