METHOD OF QUANTITATIVE THREE-DIMENSIONAL RECONSTRUCTION OF A SAMPLE SURFACE IN A SCANNING- ELECTRON MICROSCOPE Russian patent published in 2018 - IPC H01J37/28 G01N23/04 

Abstract RU 2657000 C1

FIELD: measuring equipment.

SUBSTANCE: invention relates to scanning electron microscopy. Invention uses the principle of photogrammetric processing of images obtained in a scanning electron microscope at various inclination angles the test sample. On the surface of the test sample, spherical structural elements generating a contrast in the image are preliminarily formed, the results of photogrammetric image processing are corrected for the values of the individual height of the structural elements determined from the images.

EFFECT: technical result is increased three-dimensional reconstruction accuracy.

1 cl, 2 dwg

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RU 2 657 000 C1

Authors

Darznek Sergej Andreevich

Ivanov Nikolaj Anatolevich

Karabanov Dmitrij Aleksandrovich

Mityukhlyaev Vitalij Borisovich

Todua Pavel Andreevich

Filippov Mikhail Nikolaevich

Dates

2018-06-08Published

2016-12-15Filed