FIELD: microelectronics.
SUBSTANCE: invention refers to the field of microelectronics. Technical result is achieved due to availability of two ring generators containing tested logic elements, as well as presence of two-input AND element and exclusive OR element (comparison circuit), inputs of which are connected to outputs of ring generators.
EFFECT: technical result is creation of test unit of ring generators on complementary metal-oxide-semiconductor transistors with increased universality due to possibility of testing radiation resistance of logic elements under action of separate nuclear particles.
1 cl, 2 dwg
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