FIELD: electrical engineering.
SUBSTANCE: invention refers to the field of microelectronics.
EFFECT: technical result of the claimed invention is the creation of a radiation-resistant library of elements on complementary metal-oxide-semiconductor (CMOS) transistors with a smaller area of elements on a chip vertically proportional to the step of the topological grid, increased speed and increased yield of on-chip elements due to the arrangement of p+ protection along the outer boundary of the n-type sewers / sources of transistors with different potentials, while filling p+ with protection of the entire free substrate area, as well as by connecting polysiliated gates of transistors.
1 cl, 2 dwg
| Title | Year | Author | Number | 
|---|---|---|---|
| RADIATION-RESISTANT MEMORY ELEMENT FOR STATIC RANDOM-ACCESS MEMORY DEVICES ON COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR TRANSISTORS | 2018 | 
 | RU2692307C1 | 
| RADIATION-RESISTANT ELEMENT OF MEMORY FOR STATIC OPERATIONAL MEMORIZING DEVICES ON COMPLIMENTARY METAL-OXIDE-SEMI-CONDUCTOR OF TRANSISTORS | 2018 | 
 | RU2674935C1 | 
| RADIATION-RESISTANT COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR TRANSISTOR BASED ELEMENT LIBRARY | 2013 | 
 | RU2539869C1 | 
| SYMMETRICAL MULTIPLEXER ON COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR (COMS) TRANSISTORS | 2018 | 
 | RU2689820C1 | 
| RADIATION-RESISTANT LSIC MANUFACTURING METHOD | 2010 | 
 | RU2434312C1 | 
| BICMOS DEVICE AND PROCESS OF ITS MANUFACTURE | 1996 | 
 | RU2106719C1 | 
| METHOD FOR GENERATION OF CMOS-STRUCTURES WITH POLYSILICIC GATE | 1992 | 
 | RU2056673C1 | 
| DEVICE FOR PROTECTION AGAINST STATIC ELECTRICITY DISCHARGES OF POWER LEADS OF COMPLEMENTARY MOS (METAL-OXIDE-SEMICONDUCTOR) INTEGRATED CIRCUITS ON SILICON WAFERS WITH N-TYPE CONDUCTIVITY | 2013 | 
 | RU2585882C2 | 
| PROCESS OF MANUFACTURE OF BICOS/BIMOS DEVICE | 1998 | 
 | RU2141148C1 | 
| PROCESS OF FORMATION OF CMOS STRUCTURES WITH POLYSILICON GATE | 1992 | 
 | RU2038647C1 | 
Authors
Dates
2018-12-07—Published
2018-03-06—Filed