SCANNING PROBE MICROSCOPE WITH MULTIPLE-PROBE SENSOR OPERATING DEVICE Russian patent published in 2015 - IPC G01Q60/00 

Abstract RU 2538412 C1

FIELD: physics.

SUBSTANCE: microscope with a device includes a platform (1), a sample holder (2) with a sample (3), placed on a scanning device (4), interfaced with the platform (1), an approach unit (5), a recording system (6), consisting of a radiation source (7) and a photodetector (8), a loop-type multiple-probe sensor (9), comprising a base (10) with flexible cantilevers (15), spikes (16, 17) and a first adjustment unit (18), mounted through a second adjustment unit (19) on a grip (20) interfaced with a rotary drive (21), connected to the platform (1), as well as a control unit (30) and an angular orientation unit (25) interfaced with the grip (20).

EFFECT: high accuracy of installing flexible cantilevers relative to a recording system, high working signal-to-noise ratio, enabling operation in conditions with high vibrations, acoustic and electrical noise and convectional heat and mass exchange.

23 cl, 18 dwg

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RU 2 538 412 C1

Authors

Bykov Viktor Aleksandrovich

Bykov Andrej Viktorovich

Dates

2015-01-10Published

2013-09-24Filed