HIGH EFFICIENCY OF CALCULATION FOR STRUCTURED ILLUMINATION MICROSCOPY Russian patent published in 2024 - IPC G06T5/50 

FIELD: physics.

SUBSTANCE: invention relates to structured illumination microscopy and relates to a method of obtaining an improved resolution image from target images captured under structured illumination. Method comprises converting images captured by a sensor in a spatial region from phase shifts of structured illumination along one angle, into Fourier domain to obtain frequency domain matrices, each of which includes first blocks of complex coefficients and redundant second blocks of complex coefficients. Inverse mixing matrix is applied to the first units to obtain unbiased and shifted semi-matrices with phase separation in the Fourier domain. Further, the half-matrices are processed, and full matrices are obtained from the half-matrices. Overlapping complex coefficients of full matrices are equalized and summed to obtain an extended frequency coverage matrix. Inverse transformation of the extended frequency coverage matrix from the Fourier domain is performed to obtain an image of improved resolution in the spatial domain.

EFFECT: providing the possibility of obtaining images with improved resolution and reducing the number of calculations for processing image fragments in real time.

29 cl, 57 dwg