FIELD: physics.
SUBSTANCE: invention relates to image processing systems. When generating a distortion model for a structured illumination microscopy (SIM) optical system, a sliding window moves relative to a plurality of images to form a plurality of sub-tiles, where each sub-tile is a part of the corresponding image. Parameters are evaluated for each sub-tile, wherein said parameters include two or more parameters selected from a group consisting of modulation, angle, spacing, phase shift and phase deviation, and the value of full width at half maximum (FWHM) associated with each sub-tile is estimated. Distortion model is estimated based on a combination of the estimated parameters and FWHM values stored in a given format and the estimated central window parameter.
EFFECT: two-dimensional image can be generated based on the estimated distortion model.
19 cl, 20 dwg
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RU2800625C2 |
