FIELD: physics.
SUBSTANCE: invention relates to structured illumination microscopy. Image processing method is used to generate a report representing parameter values corresponding to a structured illumination microscopy (SIM) optical system. Parameter values are based at least in part on the performed modulation calculation corresponding to the set of images captured by the optical SIM system. Minimum slice (FWHM) is determined at least in part based on the average FWHM of the images in the first set of images. Parameters are estimated at certain minimum section of FWHM. Best focusing parameters are determined based at least in part on the performed evaluation. Phase estimation is performed for each image in the set. Modulation is calculated based at least in part on the determined best focusing parameters. Report is at least partially based on the performed modulation calculation.
EFFECT: invention provides improved quality of the reconstructed image.
20 cl, 22 dwg
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