PROCESS OF MANUFACTURE OF SILICON STRUCTURES WITH DIELECTRIC INSULATION OF COMPONENTS OF INTEGRATED CIRCUITS Russian patent published in 1994 - IPC

Abstract SU 1480683 A1

FIELD: microelectronics. SUBSTANCE: in silicon substrate pattern is formed by etching. Layer of insulating silicon oxide is formed on pattern. Layer of polysilicon 0.5-2.0 μm thick doped with boron with concentration 1017-2·1020cm-3 is deposited on it. After this bearing layer of polysilicon is grown and part of substrate is taken off with opening of monosilicon sections. EFFECT: improved electrical characteristics of integrated circuits due to decrease and stabilization of charge in layer of insulating silicon oxide. 1 tbl

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SU 1 480 683 A1

Authors

Prokof'Ev S.P.

Uritskij V.Ja.

Shatalov V.F.

Dates

1994-02-15Published

1987-07-06Filed