FIELD: microelectronics. SUBSTANCE: in silicon substrate pattern is formed by etching. Layer of insulating silicon oxide is formed on pattern. Layer of polysilicon 0.5-2.0 μm thick doped with boron with concentration 1017-2·1020cm-3 is deposited on it. After this bearing layer of polysilicon is grown and part of substrate is taken off with opening of monosilicon sections. EFFECT: improved electrical characteristics of integrated circuits due to decrease and stabilization of charge in layer of insulating silicon oxide. 1 tbl
Authors
Dates
1994-02-15—Published
1987-07-06—Filed