METHOD FOR PRODUCING SEMICONDUCTOR STRUCTURES Russian patent published in 1995 - IPC

Abstract RU 2042233 C1

FIELD: semiconductor engineering. SUBSTANCE: method for producing semiconductor structures involves mechanical premachining of plates to obtain main cuts, direct connection of plates with alignment of like-polarity crystal directions along main cuts, and mechanical treatment of joined plates to desired thickness. In the course of premachining, additional mark is made on periphery of plates accurate to its crystal direction equal to main cut manufacturing accuracy which is taken into account when aligning plates. Upon connection, round structure of diameter making up maximum 95% of diameter of joined plates is cut coaxially with plates and main cut is made in parallel to cuts of joined plates. Additional marks on periphery of joined plates are made of depth not greater than diameter of cut structure. Cut or slot is used as mark. EFFECT: facilitated procedure. 3 cl, 1 tbl

Similar patents RU2042233C1

Title Year Author Number
DEVICE FOR LOW-TEMPERATURE DIRECT CONNECTION OF SEMICONDUCTOR PLATES 1992
  • Enisherlova-Vel'Jasheva K.L.
  • Bachurin V.V.
  • Fejgin Kh.I.
  • Ushakov M.A.
RU2033657C1
METHOD OF DIAGNOSING SEMICONDUCTOR EPITAXIAL HETEROSTRUCTURES 2012
  • Enisherlova-Vel'Jasheva Kira L'Vovna
  • Ljuttsau Aleksandr Vsevolodovich
  • Rusak Tat'Jana Fedorovna
RU2498277C1
DISPLAY METHOD OF CRYSTALLOGRAPHIC PLANES OF SINGLE-CRYSTAL PLATES AND HETEROSTRUCTURES 2014
  • Ljuttsau Aleksandr Vsevolodovich
  • Temper Ehlla Moiseevna
  • Enisherlova-Vel'Jasheva Kira L'Vovna
RU2559799C1
METHOD FOR STRUCTURAL INSPECTION OF SEMICONDUCTOR MULTILAYER STRUCTURE (VARIANTS) 2010
  • Enisherlova-Vel'Jasheva Kira L'Vovna
  • Ljuttsau Aleksandr Vsevolodovich
  • Temper Ehlla Moiseevna
  • Kolkovskij Jurij Vladimirovich
RU2442145C1
METHOD FOR CONTROL OF DEFECTIVENESS AND RESILIENT DEFORMATION IN SEMICONDUCTOR HETEROSTRUCTURES LAYERS 2010
  • Enisherlova-Vel'Jasheva Kira L'Vovna
  • Ljuttsau Aleksandr Vsevolodovich
  • Temper Ehlla Moiseevna
  • Kolkovskij Jurij Vladimirovich
RU2436076C1
DEVICE FOR HIGH-TEMPERATURE TREATMENT OF SEMICONDUCTOR STRIPS 1987
  • Кontsevoj Ju.А.
  • Еnisherlova-Vel'Jasheva К.L.
  • Вachurin V.V.
  • Levin А.В.
  • Vernikov М.А.
SU1547619A1
METHOD FOR MANUFACTURING SILICON-ON-INSULATOR STRUCTURE 1999
  • Rusak T.F.
  • Enisherlova-Vel'Jasheva K.L.
  • Kontsevoj Ju.A.
RU2173914C1
METHOD FOR POLISHING SEMICONDUCTOR MATERIALS 2004
  • Enisherlova-Vel'Jasheva Kira L'Vovna
  • Savushkin Jurij Aleksandrovich
  • Burobin Valerij Anatol'Evich
  • Rusak Tat'Jana Fedorovna
  • Trigubovich Tat'Jana Nikolaevna
RU2295798C2
METHOD FOR DIAGNOSTICS OF COMPOSITION AND CRYSTALLOGRAPHIC PARAMETERS OF SEMICONDUCTOR EPITAXIAL HETEROSTRUCTURES 2022
  • Rusak Tatiana Fedorovna
  • Enisherlova-Veliasheva Kira Lvovna
  • Liuttsau Aleksandr Vsevolodovich
RU2796363C1
METHOD OF GRADUATION OF RESONANCE PICKUP OF PARAMETERS OF EPITAXIAL LAYER ON CONDUCTIVE SUBSTRATE 1993
  • Tehgaj V.A.
  • Enisherlova-Vel'Jasheva K.L.
  • Detinko M.V.
RU2107356C1

RU 2 042 233 C1

Authors

Enisherlova-Vel'Jasheva Kira L'Vovna

Rogov Vladimir Viktorovich

Bachurin Viktor Vasil'Evich

Antonova Irina Aleksandrovna

Dates

1995-08-20Published

1991-09-03Filed