FIELD: electronic engineering. SUBSTANCE: transistor has part to semiconductor material layer placed at distance greater than 30 nm from gate whose dope concentration is higher than 3·1017cm-3 and surface area of this dope is greater than 1012cm-2; semiconductor material layer between mentioned part and gate has mean dope concentration ≅3·1017cm-3. EFFECT: improved linear characteristics of device built around these transistors and reduced modulation noise of such devices. 5 dwg
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Authors
Dates
1997-10-20—Published
1993-03-10—Filed