METHOD FOR TESTING RELIABILITY OF ELECTRONIC EQUIPMENT Russian patent published in 1997 - IPC

Abstract RU 2100817 C1

FIELD: electronic equipment which has extra-long service life. SUBSTANCE: method involves application of electric impact to first group of articles, application of first and second group of articles to ionizing radiation, measurement of electric characteristics of articles in both groups and judging results. Ionizing radiation level is equal to maximal permissible non- destructive dosage, electric impact for first group of articles is equal to operation conditions. Mean value of characteristics of articles in each group is calculated in order to get judgment. EFFECT: increased reliability due to possibility to detect hidden faults caused by electric impact. 1 dwg

Similar patents RU2100817C1

Title Year Author Number
METHOD FOR SELECTING PLATES WITH RADIATION-RESISTANT MOS INTEGRATED CIRCUITS 1995
  • Shumilov A.V.
  • Frolov L.N.
  • Fedorovich Ju.V.
RU2082178C1
METHOD FOR RADIATION-INDUCED DETERMINATION OF POTENTIALLY UNSTABLE SEMICONDUCTOR PRODUCTS 2008
  • Popikov Petr Ivanovich
  • Zharkikh Aleksandr Petrovich
  • Volodin Ivan Nikolaevich
RU2375719C1
METHOD OF REJECTING SEMICONDUCTOR DEVICES FOR RADIATION RESISTANCE 2003
  • Zykov V.M.
  • Junda N.T.
  • Archakov V.G.
  • Sheremet A.V.
RU2253875C2
METHOD FOR SELECTION OF RADIATION-PROOF ELECTRONIC DEVICES 1992
  • Malyshev Mikhail Mikhajlovich
  • Popov Viktor Dmitrievich
  • Filimonov Aleksej Viktorovich
RU2066869C1
METHOD FOR INCREASING RELIABILITY AND QUALITY OF FUNCTIONING BATCH OF HYBRID AND MONOLITHIC INTEGRATED CIRCUITS 2018
  • Meshkov Sergej Anatolevich
RU2684943C1
PROCESS OF PRODUCTION OF NITRIDED OXIDE LAYER ON SUBSTRATE OF SEMICONDUCTOR MATERIAL 1991
  • Kononov V.K.
  • Gromov L.A.
  • Solovejchik A.V.
RU2008745C1
PROCEDURE OF SELECTION OF ELECTRON ARTICLES BY STABILITY AND RELIABILITY 1999
  • Vasil'Eva Z.F.
  • Koskin V.V.
  • Lukitsa I.G.
  • Lysov V.B.
  • Malinin V.G.
  • Matveeva L.A.
RU2168735C2
METHOD OF INCREASING THE RELIABILITY OF HYBRID AND MONOLITHIC INTEGRATED CIRCUITS 2017
  • Meshkov Sergej Anatolevich
RU2664759C1
METHOD OF DETERMINING RESISTANCE TO RADIATION AND TEMPERATURE EFFECTS OF NANOELECTRONIC RESONANT-TUNNELING DIODE (RTD) BASED ON MULTILAYER ALGAAS (ALUMINIUM, GALLIUM, ARSENICUM) SEMICONDUCTOR HETEROSTRUCTURES 2015
  • Meshkov Sergej Anatolevich
  • Makeev Mstislav Olegovich
  • Gudkov Aleksandr Grigorevich
  • Ivanov Yurij Aleksandrovich
  • Ivanov Anton Ivanovich
  • Shashurin Vasilij Dmitrievich
  • Sinyakin Vladimir Yurevich
  • Vyuginov Vladimir Nikolaevich
  • Dobrov Vladimir Anatolevich
  • Usychenko Viktor Georgievich
RU2606174C1
METHOD FOR SORTING A BATCH OF INTEGRAL MEMORY DEVICE ON BASIS OF RADIATION RESISTANCE 2003
  • Davydov N.N.
  • Lysikhin D.A.
  • Kostrov A.V.
  • Aleksandrov D.V.
  • Zinchenko V.F.
  • Malinin V.G.
RU2249228C1

RU 2 100 817 C1

Authors

Vorontsov B.A.

Kulikov I.V.

Dates

1997-12-27Published

1991-01-14Filed